Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Feb 18, 2026～Mar 17, 2026
This ranking is based on the number of page views on our site.
1～9 item / All 9 items
High-resolution capacitive sensor
Standard products support a range from 10nm to 6000nm (6mm)! It can measure any material! It can even measure non-conductors. It is used for wafer thickness measurement and as a precision positioning device. With a resolution of 0.2nm, it is suitable for ultra-fine measurements!!
Achieved a resolution of 0.2nm with a simple probe!
Achieves a resolution of 0.2nm with a simple probe (varies by range and response frequency). It does not select the material of the measurement target (can measure conductors, semiconductors, non-conductors, anything). Realizes a long measurement range of 6mm with a capacitance sensor (a range length that can only be achieved by Lion Corporation). Recommended for those seeking stability in sensor output. For more details, please contact us or refer to the catalog. *This catalog is in English.
The usable temperature range is from -10 to 60℃! Capacitive sensor with a detection distance of 2.0±0.3mm.
We would like to introduce the capacitive sensor 'CAT-101M02-NON-T2' handled by Uchigen Co., Ltd. It is suitable for detecting conductors and dielectrics. It has electrical characteristics of a maximum consumption current of 20mA, a maximum switching current of 100mA, and a maximum residual voltage of 0.6V. 【Specifications】 ■ Detection distance: 2.0±0.3mm (at a usage voltage of 24V and at room temperature) ■ Standard detection object: Grounded metal plate (50×50×1mm) ■ Application: Detection of conductors and dielectrics ■ Operating temperature range: -10 to 60℃ ■ Protection structure: IP67 *For more details, please refer to the external link page or feel free to contact us.
Suitable for use in detecting conductors and their derivatives! Capacitive sensor with a detection distance of 5.0±1.0mm.
We would like to introduce the electrostatic capacitance sensor 'CAT-101M05-NON-T2' handled by Uchigen Co., Ltd. It is suitable for detecting conductors and inductors. It has electrical characteristics of a maximum current consumption of 20mA, a maximum switching current of 100mA, and a maximum residual voltage of 0.6V. 【Specifications】 ■ Detection distance: 5.0±1.0mm (at a usage voltage of 24V and at room temperature) ■ Standard detection object: Grounded metal plate (50×50×1mm) ■ Application: Detection of conductors and inductors ■ Operating temperature range: -10 to 60℃ ■ Protection structure: IP67 *For more details, please refer to the external link page or feel free to contact us.
Achieving nano displacement measurement with sub-nanometer resolution. An optimal non-contact displacement sensor for nano material evaluation and nano positioning.
In the field of nanotechnology, it is important to accurately measure minute displacements and deformations of materials and structures at the nanometer level. In particular, sensors capable of detecting slight changes in displacement with high resolution are required for nanomaterial evaluation, nanomeasurement, and nanopositioning. The D-050 / D-100 is a high-resolution sensor that employs a capacitive method for non-contact displacement measurement. With a maximum resolution of 0.01 nm, it enables nanometer-scale displacement measurement and high-precision position control, facilitating high-accuracy measurements in nanotechnology research and nanomeasurement systems. 【Application Scenarios】 - Evaluation of nanomaterial properties - Measurement of thin film thickness - Precise measurement of surface shapes 【Benefits of Implementation】 - Enables high-precision measurements at the nanometer scale - Minimizes the impact on materials through non-contact measurement - Allows real-time correction through multi-axis control
Sub-nanometer resolution and a maximum bandwidth of 10 kHz. Non-contact capacitive sensor ideal for wafer position control.
In semiconductor manufacturing, even slight displacements or vibrations of the wafer stage and precision positioning mechanisms can significantly impact processing accuracy and product yield. As semiconductor processes continue to miniaturize, it is crucial to measure displacements at the nanometer level with high precision. The D-510 PISeca is a high-resolution sensor that employs capacitive non-contact displacement measurement. With sub-nanometer resolution and high-bandwidth measurements of up to 10 kHz, it accurately detects minute displacements of the wafer stage and equipment vibrations, contributing to enhanced position control accuracy and process stabilization in semiconductor manufacturing equipment. 【Application Scenarios】 - Position feedback for wafer stages - Nano position control for semiconductor manufacturing equipment - Vibration measurement of wafer surfaces - Precision alignment systems - Semiconductor inspection equipment 【Benefits of Implementation】 - High-precision displacement measurement at the nanometer level - Reduced impact on wafers through non-contact measurement - High-precision monitoring of equipment vibrations - Stabilization of semiconductor processes and improvement of yield
AS3213C External Sensor Capacitive Analog Interface
Asygn AS3213C External Sensor Equipped Capacitive Analog Interface The AS3213C is an IC chip compliant with EPC™ Class-1 Generation-2 for UHF RFID applications. This chip provides advanced performance in sensor acquisition mode due to its ultra-low power internal acquisition channel. It can be powered either by RF energy transmitted from a battery or a reader. In a battery-assisted passive (BAP) configuration, the reading range is extended compared to passive RFID solutions.
Non-contact displacement sensor with a measurement range of up to 300µm and a resolution of 0.01nm.
In the field of precision machinery, high-precision displacement measurement at the nanometer level is required to enhance product performance and processing accuracy. Particularly in high-precision positioning, microfabrication, and precision measurement, it is crucial to accurately measure even slight changes in displacement. Insufficient measurement accuracy can lead to a decline in product quality and variations in equipment performance. The D-050 / D-100 is a high-resolution sensor that employs a capacitive method for non-contact displacement measurement. With a maximum resolution of 0.01nm, it enables precise displacement measurement at the nanoscale, contributing to high-precision position control in precision machinery and precision measurement systems. 【Application Scenarios】 - Precision positioning devices - Precision measurement instruments - Semiconductor manufacturing equipment - Nano positioning systems - Precision measurement in clean environments 【Benefits of Implementation】 - High-precision displacement measurement at the nanometer level - Reduced impact on the object being measured due to non-contact measurement - Realization of high-precision positioning control - High-precision feedback control in multi-axis systems
